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dc.contributor.authorRahul, S-
dc.contributor.authorNeson Varghese-
dc.contributor.authorVinod, K-
dc.contributor.authorDevadas, K M-
dc.contributor.authorSyju Thomas-
dc.contributor.authorAnees, P-
dc.contributor.authorChattopadhyay, M K-
dc.contributor.authorRoy, S B-
dc.contributor.authorSyamaprasad, U-
dc.date.accessioned2014-01-08T06:54:21Z-
dc.date.available2014-01-08T06:54:21Z-
dc.date.issued2011-
dc.identifier.citationMaterials Research Bulletin 46(11):2036-2040; Nov 2011en_US
dc.identifier.issn0025-5408-
dc.identifier.urihttp://ir.niist.res.in:8080/jspui/handle/123456789/1025-
dc.description.abstractMgB2 bulk samples added with nano SiO2 and/or nano diamond were prepared by powder-in-sealed-tube (PIST) method and the effects of addition on structural and superconducting properties were studied. X-ray diffraction (XRD) analysis revealed that the addition caused systematic reduction in 'a' lattice parameter due to the substitution of C atoms at B sites and the strain caused by reacted intragrain nano particles of Mg2Si as evinced by transmission electron microscope image. Scanning electron microscopy images showed distinct microstructural variations with SiO2/diamond addition. It was evident from DC magnetization measurements that the in-field critical current density [J(C)(H)] of doped samples did not fall drastically like the undoped sample. Among the doped samples the J(C)(H) of co-doped samples were significantly higher and the best co-doped sample yielded aJ(C), an order of magnitude more than the undoped one at 5 K and 8 T.en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectX-ray diffractionen_US
dc.subjectMagnetic propertiesen_US
dc.subjectLattice dynamicsen_US
dc.subjectSuperconductivityen_US
dc.subjectBurned rice husken_US
dc.titleCombined addition of nano diamond and nano SiO2, an effective method to improve the in-field critical current density of MgB2 superconductoren_US
dc.typeArticleen_US
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