Microwave dielectric properties of novel rare earth based silicates: RE2Ti2SiO9 [RE = La, Pr and Nd]

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DC Field	Value	Language
dc.contributor.author	Sherin, T	-
dc.contributor.author	Sayoojyam, B	-
dc.contributor.author	Sebastian, M T	-
dc.date.accessioned	2014-01-08T09:35:13Z	-
dc.date.available	2014-01-08T09:35:13Z	-
dc.date.issued	2011	-
dc.identifier.citation	Journal of Materials Science: Materials In Electronics 22(9):1340-1345;Sep 2011	en_US
dc.identifier.issn	0957-4522	-
dc.identifier.uri	http://ir.niist.res.in:8080/jspui/handle/123456789/1034	-
dc.description.abstract	The RE2Ti2SiO9 [RE = La, Nd and Pr] ceramics are synthesized by solid state ceramic route. These materials exhibit a relative permittivity of about 30 with quality factor in the range 19,600-33,700 GHz. They also showed relatively low values of tau(f). The microwave dielectric properties of these materials are studied for the first time. The La2-xPrxTi2SiO9 [x = 0-2] based solid solution are also synthesized and single phase is confirmed over the whole composition range. The lattice parameters showed a linear variation with increasing x which can be well correlated with the ionic radius of the RE3+ ions.	en_US
dc.language.iso	en	en_US
dc.publisher	Springer	en_US
dc.subject	Ceramics	en_US
dc.subject	Crystal-structure	en_US
dc.subject	Rare earth based silicates	en_US
dc.title	Microwave dielectric properties of novel rare earth based silicates: RE2Ti2SiO9 [RE = La, Pr and Nd]	en_US
dc.type	Article	en_US
Appears in Collections:	2011

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