Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/1952
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dc.contributor.authorKataria, N D-
dc.contributor.authorJawahar, I N-
dc.contributor.authorSebastian, M T-
dc.date.accessioned2015-08-09T12:01:49Z-
dc.date.available2015-08-09T12:01:49Z-
dc.date.issued2006-
dc.identifier.citationMaterials Letters 60(21-22):2642-2644;Sep 2006en_US
dc.identifier.issn0167-577X-
dc.identifier.urihttp://ir.niist.res.in:8080/jspui/handle/123456789/1952-
dc.description.abstractThe microwave properties of ceramic dielectric resonators in a stack configuration are investigated using two different dielectric materials with opposite temperature coefficients of resonant frequency in the temperature range 50-300 K. The two dielectrics, which have been studied, are Ba(5)Nb(4)O(15) and 5ZnO-Nb(2)O(5), synthesized by the conventional solid-state ceramic route. The temperature coefficient of resonant frequency of the stack resonator is tuned by varying the volume fraction of 5ZnO-Nb(2)O(5). Temperature coefficient of resonant frequency slowly changed from a non-linear to almost a linear behavior with increase in the volume fraction of 5ZnO-Nb(2)O(5).en_US
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectDielectric materialsen_US
dc.subjectOscillatoren_US
dc.titleTuning the properties of microwave dielectric resonators in a stack configurationen_US
dc.typeArticleen_US
Appears in Collections:2006

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