Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics

Abstract

MgTe2O5 ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640-720 degrees C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4-6 GHz. The MgTe2O5 ceramics have a dielectric constant (epsilon(r)) of 10.5, quality factors (Q(u) x f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (tau(f)) of -45 ppm/degrees C at the optimized sintering temperature of 700 degrees C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.