Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/2129
Title: Nanostructural and surface morphological evolution of chemically sprayed SnO2 thin films
Authors: Chacko, S
Philip, N S
Gopchandran, K G
Peter Koshy
Vaidyan, V K
Keywords: Oxygen vacancies
Structural and optical properties
IR band at 530 cm(-1) in SnO2 thin films
Tin oxide-films
Lattice-dynamics
Raman-spectrum
Electrical-properties
Vapor-deposition
Rutile structure
Photoluminescence
Pyrolysis
Issue Date: 2008
Publisher: Elsevier
Citation: Applied Surface Science 254(7):2179-2186;30 Jan 2008
Abstract: Physical properties of a nanocrystalline thin film is greatly influenced by its morphological and structural evolution. We try to understand the transition of SnO2 thin films from amorphous to nanocrystalline structure with XRD, IR, SEM, AFM and surface profiler studies. A 2D layer like structure resulting from quantum confinement is found for the films prepared at 400 degrees C. We observed a new IR band at 530 cm(-1) that was theoretically predicted and report it for the first time. A correlation of population of defects in SnO2 films with change in lattice parameters and FWHM of IR bands are reported. The electric and optical properties of the films have been discussed.
URI: http://ir.niist.res.in:8080/jspui/handle/123456789/2129
ISSN: 0169-4332
Appears in Collections:2008

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