Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/2643
Title: Growth and Characterization of Indium Oxide Thin Films Prepared by Spray Pyrolysis
Authors: Manoj, P K
Gopchandran, K G
Peter Koshy
Vaidyan, V K
Benny Joseph
Keywords: Indium oxide
Chemical deposition
Optical constants
Issue Date: Sep-2006
Publisher: Elsevier
Citation: Optical Materials, 28(12):1405-1411
Abstract: Highly transparent and conducting indium oxide thin films are prepared on glass substrates from precursor solution of indium chloride. These films are characterized by X-ray diffraction, scanning electron microscopy and optical transmission. The preferential orientation of these films is found to be sensitive to deposition parameters. A comparative study has been made on the dependence on the thickness of the film on substrate temperatures with aqueous solution and 1:1 C2H5OH and H2O as precursors. Films deposited at optimum conditions have 167 nm thickness and exhibited a resistivity of 2.94 × 10−4 Ω m along with transmittance better than 82% at 550 nm. The analytical expressions enabling the derivation of the optical constants of these films from their transmission spectrum only have successfully been applied. Finally, the refractive index dispersion is discussed in terms of the single-oscillator Wemple and Didomenico model.
URI: http://hdl.handle.net/123456789/2643
Appears in Collections:2006

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