Please use this identifier to cite or link to this item: http://ir.niist.res.in:8080/jspui/handle/123456789/544
Title: Fabrication and characterization of Co, Al:ZnO thin films by a sol-gel spin coating technique for ferromagnetic applications
Authors: Siddheswaran, R
Mangalaraja, R V
Avila, R E
Gomez, M E
Manikandan, D
Lopez, M
Esther Jeyanthi, C
Ananthakumar, S
Keywords: Ferromagnetism
Microstructure
Morphology
Spin coating
Al:ZnO thin film
Issue Date: 2012
Publisher: Hanyang University Press
Citation: Journal of Ceramic Processing Research 13(6):801-805;2012
Abstract: Transparent polycrystalline ZnO and Co,Al co-doped ZnO [Zn1-x-yCoxAlyO; x = 0.03; y = 0.02] thin films were fabricated using sol-gel spin coating on glass substrates and subsequently annealed at 500 οC for 2 h in an ambient atmosphere. The decomposition of the precursors and formation of the metal oxide during annealing was explained by thermal analysis. X-ray crystal diffraction analysis on the co-doped ZnO thin films confirmed the formation of the hexagonal wurtzite structure.Microstructural studies revealed that the films were filled with particulates of sizes ranging between 40-50 nm and with a uniform film thickness of about 700 nm after annealing at 500 οC. Atomic force microscopy (AFM) images demonstrated a fine and smooth surface of the thin films. The spin coated films have also been shown to possess polycrystalline grains with a compact and void-free morphology. The energy dispersive X-ray spectroscopic (EDS) analysis confirmed the presence of Co,Al, Zn and O. The room temperature (300 K) ferromagnetic behavior of Co, Al co-doped ZnO thin films is also discussed
URI: http://hdl.handle.net/123456789/544
Appears in Collections:2012

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