Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/729
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dc.contributor.authorJames, T J-
dc.contributor.authorShyla, J-
dc.contributor.authorAnnamma, J-
dc.contributor.authorThomas, J K-
dc.contributor.authorPrasad, V S-
dc.contributor.authorSam Solomon-
dc.date.accessioned2013-11-13T04:58:56Z-
dc.date.available2013-11-13T04:58:56Z-
dc.date.issued2011-
dc.identifier.citationJournal of Materials Science-Materials in Electronics 22(3):228-232;Mar 2011en_US
dc.identifier.issn0957-4522-
dc.identifier.urihttp://ir.niist.res.in:8080/jspui/handle/123456789/729-
dc.description.abstractMicrowave dielectric ceramics of the type (Sm0.5Y0.5)Ti(Nb1-x Ta (x) )O-6 were prepared for x = 0, 0.2, 0.4, 0.6, 0.8 and 1 through the conventional solid state ceramic route. The ball-milled compositions were calcined at 1,250 A degrees C. The cylindrical pellets were sintered at temperatures between 1,385 and 1,450 A degrees C. The densities were determined by Archimedes method. The structure was analyzed using X-ray diffraction method. The microwave dielectric properties of the polished pellets were measured using cavity resonator method. The morphological studies were done using Scanning Electron Microscopy and Transmission Electron Microscopy. The Raman spectra were recorded and analyzed to confirm the structural change. The photoluminescence spectra were also taken and the emission lines were identified. A correlation study was done among the measured properties and parameters. Most of the samples have high dielectric constant, high quality factor and low temperature coefficient of resonant frequency and hence suitable for microwave applications.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.subjectDielectric-propertiesen_US
dc.subjectResonatorsen_US
dc.titleStructural, spectroscopic and microwave characterizations of (Sm0.5Y0.5) Ti (Nb1-x Ta (x) )O-6 ceramicsen_US
dc.typeArticleen_US
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