Abstract:
MgB2 bulk samples added with nano SiO2 and/or nano diamond were prepared by powder-in-sealed-tube (PIST) method and the effects of addition on structural and superconducting properties were studied. X-ray diffraction (XRD) analysis revealed that the addition caused systematic reduction in 'a' lattice parameter due to the substitution of C atoms at B sites and the strain caused by reacted intragrain nano particles of Mg2Si as evinced by transmission electron microscope image. Scanning electron microscopy images showed distinct microstructural variations with SiO2/diamond addition. It was evident from DC magnetization measurements that the in-field critical current density [J(C)(H)] of doped samples did not fall drastically like the undoped sample. Among the doped samples the J(C)(H) of co-doped samples were significantly higher and the best co-doped sample yielded aJ(C), an order of magnitude more than the undoped one at 5 K and 8 T.
