Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics

dc.contributor.author	Subodh, G
dc.contributor.author	Ratheesh, R
dc.contributor.author	Jacob, M V
dc.contributor.author	Sebastian, M T
dc.date.accessioned	2015-09-14T16:49:30Z
dc.date.available	2015-09-14T16:49:30Z
dc.date.issued	2008
dc.identifier.citation	Journal of Materials Research 23(6):1551-1556;Jun 2008	en_US
dc.identifier.issn	0884-2914
dc.identifier.uri	http://ir.niist.res.in:8080/jspui/handle/123456789/2050
dc.description.abstract	MgTe2O5 ceramics were prepared by solid-state route. These materials were sintered in the temperature range of 640-720 degrees C. The structure and microstructure of the compound was investigated using x-ray diffraction (XRD), Fourier transform infrared (FTIR), Raman spectroscopy, and scanning electron microscopy (SEM) techniques. The dielectric properties of the ceramics were studied in the frequency range 4-6 GHz. The MgTe2O5 ceramics have a dielectric constant (epsilon(r)) of 10.5, quality factors (Q(u) x f) of 61000 at 5.3 GHz, and temperature coefficient of resonant frequency (tau(f)) of -45 ppm/degrees C at the optimized sintering temperature of 700 degrees C. The microwave dielectric properties of these materials at cryogenic temperatures were also investigated.	en_US
dc.language.iso	en	en_US
dc.publisher	Materials Research Society	en_US
dc.subject	LTCC Technology	en_US
dc.subject	Tellurates	en_US
dc.title	Microwave dielectric properties and vibrational spectroscopic analysis of MgTe2O5 ceramics	en_US
dc.type	Article	en_US