Abstract:
The La5CrTi3O15 and La4MCrTi3O15 (M=Pr, Nd, and Sm) microwave dielectric ceramics were prepared by the conventional solid-state ceramic route. The structure and microstructure of the ceramics were studied by X-ray diffraction and scanning electron microscopy methods. The dielectric properties of the ceramics were measured in the microwave frequency region using a network analyzer by the resonance method. The ceramics show a dielectric constant (epsilon(r)) in the range of 37 to 39.5, a quality factor (Q(u)xf(o)) 17,300 to 34,000 GHz, and a temperature coefficient of resonant frequency (tau(f)) in the range from -22 to -38 ppm/degrees C.
