Microwave dielectric properties of La5CrTi3O15 and La4MCrTi3O15 (M = Pr, Nd, and Sm) ceramics

dc.contributor.author	Rejini, R
dc.contributor.author	Sebastian, M T
dc.date.accessioned	2016-01-18T08:20:40Z
dc.date.available	2016-01-18T08:20:40Z
dc.date.issued	2006
dc.identifier.citation	International Journal of Applied Ceramic Technology 3(3):230-235;May 2006	en_US
dc.identifier.issn	1546-542X
dc.identifier.uri	http://ir.niist.res.in:8080/jspui/handle/123456789/2199
dc.description.abstract	The La5CrTi3O15 and La4MCrTi3O15 (M=Pr, Nd, and Sm) microwave dielectric ceramics were prepared by the conventional solid-state ceramic route. The structure and microstructure of the ceramics were studied by X-ray diffraction and scanning electron microscopy methods. The dielectric properties of the ceramics were measured in the microwave frequency region using a network analyzer by the resonance method. The ceramics show a dielectric constant (epsilon(r)) in the range of 37 to 39.5, a quality factor (Q(u)xf(o)) 17,300 to 34,000 GHz, and a temperature coefficient of resonant frequency (tau(f)) in the range from -22 to -38 ppm/degrees C.	en_US
dc.language.iso	en	en_US
dc.publisher	Blackwell Publishing	en_US
dc.subject	Permittivity	en_US
dc.subject	Perovskite	en_US
dc.subject	Resonator	en_US
dc.title	Microwave dielectric properties of La5CrTi3O15 and La4MCrTi3O15 (M = Pr, Nd, and Sm) ceramics	en_US
dc.type	Article	en_US