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Tackling the Agglomeration of Mg2Si Dopant in MgB2 Superconductor Using Cast Mg-Si Alloy

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dc.contributor.author Rahul, S
dc.contributor.author Syju Thomas
dc.contributor.author Devadas, K M
dc.contributor.author Neson Varghese
dc.contributor.author Paulose, A P
dc.contributor.author Manoj Raama Varma
dc.contributor.author Syamaprasad, U
dc.date.accessioned 2018-06-19T11:28:15Z
dc.date.available 2018-06-19T11:28:15Z
dc.date.issued 2017-09
dc.identifier.citation Materials Research Bulletin, 93:296-302 en_US
dc.identifier.uri http://10.10.100.66:8080/xmlui/handle/123456789/3112
dc.description.abstract The work demonstrates a method to tackle the agglomeration of Mg2Si dopant in chemical doping in MgB2 superconductor to enhance its in-field critical current density. Mg-Si alloy which has uniformly distributed Mg2Si particles in it is prepared by casting technique. The alloy is used as the Mg source for the preparation of MgB2 samples doped with various weight percentage of nano carbon. XRD patterns show peaks of Mg2Si in all Si containing samples. SEM images show a microstructure with distinctly smaller grains and reduced crystallinity in doped samples. HRTEM analysis confirms that the method led to better distribution of Mg2Si particles within the MgB2 grains as compared to the normally prepared sample. It is found that doping has not severely affected the transition temperature of the samples and at the same time enhanced the in-field critical current density. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.subject A. Superconductors en_US
dc.subject B. Microstructure en_US
dc.subject C. X-ray diffraction en_US
dc.subject C. Transmission electron microscopy (TEM) en_US
dc.subject D. Superconductivity en_US
dc.title Tackling the Agglomeration of Mg2Si Dopant in MgB2 Superconductor Using Cast Mg-Si Alloy en_US
dc.type Article en_US


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