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Silicon Shadow Mask Technology for Aligning and In Situ Sorting of Semiconducting SWNTs for Sensitivity Enhancement: A Case Study of NO2 Gas Sensor

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dc.contributor.author AGARWAL, P B
dc.contributor.author SHARMA, R
dc.contributor.author MISHRA, D
dc.contributor.author THAKUR, N K
dc.contributor.author AGARWAL, A
dc.contributor.author AJAYAGHOSH, A
dc.date.accessioned 2021-02-08T14:13:43Z
dc.date.available 2021-02-08T14:13:43Z
dc.date.issued 2020-09-09
dc.identifier.citation Applied Materials & Interfaces; 12(36):40901-40909 en_US
dc.identifier.uri https://pubs.acs.org/doi/pdf/10.1021/acsami.0c10189
dc.identifier.uri http://hdl.handle.net/123456789/3677
dc.description.abstract Single-walled carbon nanotubes (SWNTs) are incorporated in different device configurations such as chemiresistors and field-effect transistors (FETs) as a sensing element for the fabrication of highly sensitive and specific biochemical sensors. For this purpose, sorting and aligning of semiconducting SWNTs between the electrodes is advantageous. In this work, a silicon shadow mask fabricated using conventional semiconductor processes and silicon bulk micromachining was used to make metal contacts over SWNTs with a minimum feature of 1 μm gap between the electrodes. The developed silicon shadow mask-based metal contact patterning process is cost-effective and free from photoresist (PR) chemical coatings and thermal processing. After a detailed investigation, sodium dodecyl sulfate (SDS), an anionic surfactant, along with ultrasonication process, was found to be effective for the removal of unclamped and metallic SWNTs, resulting in aligned and clamped semiconducting SWNTs between the electrodes. The presence of aligned semiconducting SWNTs was confirmed using atomic force microscopy (AFM), field emission scanning electron microscopy (FESEM), and Raman spectroscopy techniques. The fabricated devices were tested for nitrogen dioxide (NO2) gas sensing as a test case. The sensitivity enhancement of ∼21 to 76% in the 20–80 ppm NO2 concentration range has been observed in the case of aligned semiconducting SWNT devices compared to the random network SWNT-based sensors. en_US
dc.language.iso en en_US
dc.publisher American Chemical Society en_US
dc.subject sodium dodecyl sulfate en_US
dc.subject sensors en_US
dc.subject electrodes en_US
dc.subject deposition en_US
dc.subject carbon nanotubes en_US
dc.title Silicon Shadow Mask Technology for Aligning and In Situ Sorting of Semiconducting SWNTs for Sensitivity Enhancement: A Case Study of NO2 Gas Sensor en_US
dc.type Article en_US


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  • 2020
    Research articles authored by NIIST researchers published in 2020

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