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Investigating the singlet and triplet exciton recombination zone in organic light emitting diodes: Insights into field dependence, economic material usage and efficiency roll off

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dc.contributor.author Anjaly, S
dc.contributor.author Shashwath, K
dc.contributor.author Vipin, C K
dc.contributor.author Darshan, V
dc.contributor.author Narayanan Unni, K N
dc.date.accessioned 2025-11-20T08:08:46Z
dc.date.available 2025-11-20T08:08:46Z
dc.date.issued 2015-02-15
dc.identifier.citation Physica B: Condensed Matter; 699:416835 en_US
dc.identifier.uri https://www.sciencedirect.com/science/article/pii/S0921452624011761?via%3Dihub
dc.identifier.uri http://localhost:8080/xmlui/handle/123456789/5084
dc.description.abstract The optimum extent of the emissive layer (EML) in an organic light emitting diode (OLED) has a critical influence on the device efficiency. It is required to have an optimum thickness of the EML enabling maximum exciton harvesting without sacrificing carriers towards non-recombination current nor allowing an increased device resistance. Herein, the mapping of singlet and triplet exciton diffusion was done in an OLED by the spatial deployment of luminescent probes and studying the corresponding electroluminescence (EL) spectrum. The singlet and triplet emission zones in an EML of 8-hydroxyquinoline aluminum (Alq3), were mapped by inserting a fluorescent probe of 4-(Dicyanomethylene)-2-tert-butyl-6-(1,1,7,7-tetramethyljulolidin-4-yl-vinyl)-4H-pyran (DCJTB) or a phosphorescent probe of platinum octaethylporphyrin (PtOEP), at different distances from the hole transport layer (HTL)/EML interface. The influence of the electric field on the exciton recombination was also studied. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.subject organic light emitting diode en_US
dc.subject exciton diffusion en_US
dc.subject emission zone en_US
dc.subject recombination en_US
dc.title Investigating the singlet and triplet exciton recombination zone in organic light emitting diodes: Insights into field dependence, economic material usage and efficiency roll off en_US
dc.type Article en_US


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  • 2025
    Research articles authored by NIIST researchers published in 2025

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